RISC-V Hardware Acceleration for wireless communication” was published by researchers at TU Dresden and Centre for Tactile ...

RTL Benchmark for SystemVerilog Generation of Communication Protocols” was published by researchers at University of Illinois ...

Targeted design for test, better fault models, and in-system testing must keep pace with advanced-node components.

“The truthfulness or reliability of the data, which refers to the data quality and the data value. Big data must not only be ...

Identify early indicators of risk by analyzing timing margin data from within the chip.

Pseudo-random testing patterns are inadequate for meeting the stringent requirements of automotive electronics.

In today’s semiconductor industry, machine learning (ML) is no longer a buzzword — it’s an operational necessity. From ...

Shift right, then left is becoming more common for test and inspection in mission- and safety-critical applications.

White light scanning interferometer (WLSI) systems are also used in RDL process monitoring. These methods rely on ...

The collaboration focuses on leveraging data and machine learning to bridge the gap between design and manufacturing. PDF ...

A new technical paper titled “Metrics and Methodology for Hardware Security Constructs” was published by NIST. Abstract ...

Chips in automobiles, trucks, and buses are subject to extremes of temperature, humidity, vibration, and radiation. The challenges of designing for these environmental conditions have grown more ...